Title: Parameter estimation of silicon wafer for space mass-spectrometric applications in near-to-real conditions at a Cockroft-Walton 30-300 keV particle accelerator

Authors: Simeonov, L.I.

Reference: Proc. of the Nat.Conf. with Intern.Part:ELECTRONICA 2000, Botevgrad, 111-117, 2000.

The pre-flight performance evaluation tests of particle detectors require the use of different experimental approaches and the choice for implementation is decided by expected extent of solution of the particular physical problem. The test of detectors, which are prepared for space research must be performed best of all in near-to-real conditions. The first measurements of the characteristic parameters of the solid-state detector compartment of STOF (Suprathermal Time-Of-Flight) sensor of the spectrometric system CELIAS on SOHO were performed at the particle accelerator complex of the Max-Planck-Institut für Aeronomie in Lindau/Harz. The test were accomplished with two detector diodes with total of 32 pixels, each connected to an individual input of a readout amplifier system. The core of this readout electronics, which is a special adaptation for the purposes of STOF sensor is a monolithic high-integration chip, containing 32 charge-sensitive amplifier channels with analog mutiplexing, called CAMEX and steered by a digital chip, called TIMEX. The measurements in the accelerator were accomplished with ion beams of the elements H, He, Ne, O and Ar at energies from 100 to 300 KeV in discrete steps of 50 KeV.

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Last Update: 22 December 2002, Xuyu Wang