• Refereed publications
• Selected other publications
• Presentations: talks

Refereed publications

• Time-dependent diffraction studies of Au(100) electrode surface

  D. Kaminski, K. Krug, F. Golks, J. Stettner, O.M. Magnussen, J. Phys. Chem. C, in press (2007)



• Investigating surface dynamics with inelastic X-ray scattering

  B.M. Murphy, M. Müller, J. Stettner, H. Requardt, J. Serrano, M. Krisch, W. Press, Journal of Physics C: Condensed Matter, submitted (2007)



• Structure and redox behavior of azobenzene-containing monolayers on Au(111)

  J. Jung, B. Baisch, D. Kaminski, K. Krug, A. Elsen, T. Weineisen, J. Stettner, O.M. Magnussen, Langmuir, submitted (2007)



• In-situ diffraction studies of electrode surface structure during gold electrodeposition

  O.M. Magnussen, K. Krug, A.H. Ayyad, J. Stettner, Electrochim. Acta, submitted (2006)



• In-situ surface x-ray diffraction studies of homoepitaxial electrochemical growth on Au(100)

  K. Krug, J. Stettner, O.M. Magnussen, Phys. Rev. Lett., 96 246101 (2006)



• Phonon modes at the 2H-NbS₂ surface observed by grazing incidence inelastic x-ray scattering

  B.M. Murphy, H. Requardt, J. Stettner, J. Serrano, M. Krisch, M. Müller, W. Press, Phys. Rev. Lett. 95 (2005) 256104



• Electrocompression of the Au(111) surface layer during Au electrodeposition

  A. Ayyad, J. Stettner, O. Magnussen, Phys. Rev. Lett. 94 (2005) 066106



• Embedding of gold nanoclusters on polystyrene surfaces: influence of the surface modification on the glass transition

  R. Weber, I. Grotkopp, J. Stettner, M. Tolan, W. Press, Macromolecules 36 (2003) 9100



• Surface behaviour at the charge density wave transition in NbSe₂

  B.M. Murphy, J. Stettner, M. Traving, M. Sprung, I. Grotkopp, M. Müller, M. Tolan, W. Press, Physica B 336 (2003) 103



• Band structure of the misfit compound (PbS)NbS₂ compared to NbSe₂: Experiment and theory

  J. Brandt, J. Kanzow, K. Roßnagel, L. Kipp, M. Skibowski, E. Krasowskii, W. Schattke, M. Traving, J. Stettner, W. Press, C. Dieker, W. Jäger, J. Electron. Spectrosc. relat. Phenom. 114-116 (2001) 555



• X-ray reflecivity study on the surface and bulk glass transition of polystyrene

  R. Weber, K.-M. Zimmermann, M. Tolan, J. Stettner, W. Press, O.H. Seeck, J. Erichsen, V. Zaporojtchenko, T. Strunskus, F. Faupel Phys. Rev. E 64 (2001) 061508/1-5



• Phase determination of x-ray reflection coefficients

  K.-M. Zimmermann, M. Tolan, R. Weber, J. Stettner, A.K. Doerr, W. Press, Phys.Rev. B 62 (2000) 10377-10382



• X-Ray Scattering Study of Porous Silicon Layers

  V. Chamard, G. Dolino, J. Stettner, Physica B 283 (2000) 135--138



• Kinetic Evolution of Self-Organised SiGe Nanostructures

  A. Ronda, A. Abdallah, J. M. Gay, J. Stettner, I. Berbezier, Appl.Surf.Sci. 162-163 (2000) 576--583



• Structural investigation of oxidized allotaxially grown CoSi₂ on Si(001) by X-ray scattering

  I.D. Kaendler, J.-P. Schlomka, M. Tolan, J. Stettner, W. Press, L. Kappius, S. Mantl , J.Appl.Phys. 87 (2000) 133--140



• X-ray Characterization of buried allotaxially grown CoSi₂layers in Si(100)

  U. Zimmermann, J.-P. Schlomka, M. Tolan, J. Stettner, W. Press, M. Hacke, S. Mantl, J.Appl.Phys. 83 (1998) 5823-5830



• Kadar-Parisi-Zhang growth of amorphous silicon on Si/SiO₂

  M. Lütt, J.-P. Schlomka, M. Tolan, J. Stettner, O.H. Seeck, W. Press, Phys.Rev. B 56 (1997) 4085-4091



• Correlations in the interface structure of Langmuir-Blodgett-films observed by x-ray scattering

  V. Nitz, M. Tolan, J.-P. Schlomka, O.H. Seeck, J. Stettner, W. Press, M. Stelzle, E. Sackmann, Phys.Rev. B 54 (1996) 5038-5050



• Characterization of Si/Ge interfaces by diffuse X-ray scattering in the region of total external reflection

  J.-P. Schlomka, M.R. Fitzsimmons, R. Pynn, J. Stettner, O.H. Seeck, M. Tolan, W. Press, Physica B 221 (1996) 44-52



• Roughness of surfaces and interfaces

  W. Press, M. Tolan, J. Stettner, O.H. Seeck, J.-P. Schlomka, V. Nitz, L. Schwalowsky, P. Müller-Buschbaum, D.Bahr, Physica B 221 (1996) 1-9



• Interface structure of MBE-grown CoSi₂/Si/CoSi₂ layers on Si(111): Partially correlated roughness and diffuse x-ray scattering

  J. Stettner, L. Schwalowsky, O. H. Seeck, M. Tolan, W. Press, C. Schwarz, H. v. Känel, Phys.Rev.B 51 (1995) 2311-2321



• X-ray Diffraction from Si/Ge Layers: Diffuse Scattering in the Region of Total External Reflection

  J.-P. Schlomka, M. Tolan, L. Schwalowsky, O.H. Seeck, J. Stettner, W. Press, Phys.Rev.B 51 (1995) 2311-2321



• X-ray Diffraction from Mesoscopic Systems

  W. Press, D. Bahr, M. Tolan, B. Burandt, M. Müller, P. Müller-Buschbaum, V. Nitz, J. Stettner, Physica B 198 (1994) 42-47



• X-ray grazing incidence diffraction from polycrystalline Sb films on single-crystal substrates

  E. Findeisen, L. Brügemann, J. Stettner, M. Tolan, Journal of Physics C: Condensed Matter 5 (1993) 8149-8158

Selected other publications

• In-situ time-dependent studies of the homoepitaxial growth on Au(001) and Cu(001)

  F. Golks, D. Kaminski, K. Krug, J. Stettner, O.M. Magnussen, European Synchrotron Radiation Facility User Report (2007)



• Microscopic growth kinetics of gold electroplating

  K. Krug, J. Stettner, O.M. Magnussen, ESRF highlights (2006)



• In-situ time-dependent studies of the homoepitaxial growth of Au on Au(001) and Au(111)

  K. Krug, D. Kaminski, J. Stettner, O.M. Magnussen, European Synchrotron Radiation Facility User Report (2006)



• Structural characterization of thin layers of switching molecules

  U. Jung, D. Kaminski, K. Krug, A. Elsen, T. Weineisen, J. Stettner, O.M. Magnussen, HASYLAB Annual report (2006) 1033



• Dynamics at the Surface and Beyond

  B.M. Murphy, H. Requardt, J. Stettner, J. Serrano, M. Krisch, M. Müller, W. Press, ESRF Highlights (2005) 5



• In-situ surface x-ray diffraction studies of Au electrodeposition processes

  O.M. Magnussen, J. Stettner,A. Ayyad, K. Krug, European Synchrotron Radiation Facility User Report (2005)



• Bulk and surface inelastic x-ray scattering investigation of the charge density wave material NbSe₂

  B.M. Murphy, M. Müller, J. Stettner, H. Requardt, W. Press, European Synchrotron Radiation Facility User Report (2005)



• Electrocompression during Au electrodeposition

  A.H. Ayyad, J. Stettner, O.M. Magnussen, ESRF Highlights (2004) 72



• Diffusion of very dilute gold clusters in thin polymer films studied in-situ by GISAXS

  V. Chamard, C. Gutt, M. Sprung, R. Fendt, M. Tolan, J. Stettner, R. Weber, European Synchrotron Radiation Facility User Report (2004)



• In-situ surface x-ray diffraction studies of Au electrodeposition processes

  O.M. Magnussen, J. Stettner, A. Ayyad, European Synchrotron Radiation Facility User Report (2004)



• Bulk and surface inelastic x-ray scattering investigation of the charge density wave material NbSe₂

  B.M. Murphy, M. Müller, J. Stettner, H. Requardt, W. Press, European Synchrotron Radiation Facility User Report (2004)



• Surface dynamics study of confined polymers using x-ray photon correlation spectroscopy

  V. Chamard, M. Krämer, J. Stettner, M. Tolan, European Synchrotron Radiation Facility User Report (2003)



• Grazing incidence diffraction investigation of NbSe₂ charge density wave phase transition

  B.M. Murphy, J. Stettner, I. Grotkopp, M. Müller, P. Hatton, W. Press, European Synchrotron Radiation Facility User Report (2003)



• In-situ X-ray diffraction study on the electrodeposition of Au on Au(111)

  A. Ayyad, J. Stettner, O. Magnussen, HASYLAB Annual report (2003) 757



• Oberflächennahe Phasenübergänge mit Ladungsdichtewellen in Schichtkristallen

  B.M. Murphy, J. Stettner, M. Traving, M. Müller, M. Tolan, W. Press, Z. Krist., Suppl. Vol. 19 (2002) 72



• Surface behaviour at the charge density wave transition in NbSe₂

  B.M. Murphy, J. Stettner, M. Traving, M. Müller, M. Tolan, W. Press, Z. Krist., Suppl. Vol. 19 (2002) 70



• Glass transition at the surfaces of polymer films probed by GISAXS from gold/polymer samples

  R. Weber, J. Stettner, V. Chamard, C. Gutt, T.H. Metzger, M. Tolan, W. Press, European Synchrotron Radiation Facility User Report (2002)



• Surface study of the charge density wave transition in NbSe₂

  B.M. Murphy, J. Stettner, M. Sprung, I. Grotkopp, M. Müller, M. Tolan, W. Press, HASYLAB Annual report (2002) 693



• X-Ray Scattering at Metal-Polymer Interfaces near the Glass Transition

  R. Weber, I. Grotkopp, J. Stettner, M. Tolan, O.H. Seeck, W. Press, HASYLAB Annual report (2001) 719



• NbSe₂ surface phase transitions

  B.M. Murphy, J. Stettner, M. Traving, T. Kurbjuhn, M. Müller, M. Tolan, W. Press, HASYLAB Annual report (2001) 523



• The phase transitions of TaSe₂ and NbSe₂

  M. Traving, J. Stettner, W. Prange, R. Weber, M. Tolan, W. Press, HASYLAB Annual report (2000) 619



• Comparison of the Surface and Bulk Glass Transition of Polystyrene

  R. Weber, K.-M. Zimmermann, M. Tolan, J. Stettner,O.H. Seeck, J. Erichsen,T. Strunskus, W. Press, HASYLAB Annual report (2000) 661



• Annealing behaviour of Metal Clusters on Polycarbonate Surfaces near the Glass Transition Temperature

  R. Weber, M. Zimmermann, J. Stettner, M. Tolan, W. Press, V. Zaporojtchenko, K. Dolgner, T. Strunskus, HASYLAB Annual report (1999) 671



• Concentration profiles in thin films of binary liquids

  W. Prange, M. Tolan, J. Stettner, R. Weber, M. Zimmermann, M. Traving, W. Press, HASYLAB Annual report (1999) 373



• Surface structure of glasses: Freezing of capillary waves?

  T. Seydel, W. Prange, A. Doerr, J. Stettner, M. Tolan, W. Press, P. Howes, K. Kjær, HASYLAB Annual report (1998) 479



• Untersuchung der Struktur von adsorbiertem Tetramethylzinn auf einkristallinem MgO(100)

  M. Strzelczyk, J. Stettner, B. Asmussen, W. Press, HASYLAB Annual report (1997) 444



• Investigation of Cu-polyimide interfaces

  J. Stettner, A. Doerr, T. Seydel, M. Tolan, W. Press, F. Faupel, HASYLAB Annual report (1997) 404



• Structural Characterization and Annealing Behaviour of Ion Beam Sputtered NiMnSb Multilayer Systems

  J.-P. Schlomka, J. Stettner, T. Seydel, A. Doerr, M. Tolan, W. Press, HASYLAB Annual report (1997) 394



• Röntgenstreuung an Grenzflächen und dünnen Schichten: Beiträge zur Materialforschung

  W. Press, J. Stettner, M. Tolan, D. Bahr, Z. Krist., Suppl. Vol. 9 (1995) 10



• Structrual investigation of natural superlattices in III-V semiconductor alloys

  J.-P-Schlomka, J. Stettner, O.H. Seeck, M. Tolan, W. Press, HASYLAB Annual report (1994) 473



• Investigation of buried MBE-CoSi₂-islands on Si(111)

  J. Stettner, O.H. Seeck, J.-P-Schlomka, M. Tolan, W. Press, HASYLAB Annual report (1994) 361



• X-ray scattering of Langmuir-Blodgett films on silicon (100)

  V. Nitz, J. Stettner, J. Süßenbach, W. Press, HASYLAB Annual report (1993) 407



• Investigation of ultrathin, buried MBE-CoSi₂-layers on Si(111)

  J. Stettner, L. Schwalowsky, V. Nitz, W. Press, HASYLAB Annual report (1993) 395



• Temperature dependent grazing incidence diffraction experiments in a NH₄Br(110)-surface

  B. Burandt, D. Bahr, M. Tolan, J. Stettner, W. Press, HASYLAB Annual report (1991) 366

Presentations: talks

• Kompression der Au(111) Oberflächenschicht während homoepitaktischer elektrochemischer Abscheidung

  J. Stettner, A. Ayyad, O. Magnussen, 69. Jahrestagung der Deutschen Physikalischen Gesellschaft mit dem Arbeitskreis Festkörperphysik, Berlin, 4.-9.3. 2005



• Der Ladungsdichtewellen-Phasenübergang an NbSe₂-Oberflächen

  J. Stettner, Seminar des Lehrstuhls Experimentelle Physik I, Universität Dortmund, 26.2.2003



• Charge density wave transition at NbSe₂-surfaces investigated by X-ray diffraction

  J. Stettner, Kolloquium der Fakultät für Physik, Adam Mickiewicz University, Poznan, 7.6.2002



• Oberflächennahe Phasenübergänge mit Ladungsdichtewellen in Schichtkristallen

  J. Stettner, B. Murphy, M. Traving, M. Müller, M. Tolan, W. Press, 10. Jahrestagung der Deutschen Physikalischen Gesellschaft für Kristallographie, Kiel, 4.-7.3.2002



• Röntgen-Reflexionsmessungen an Cu/Polyimid-Schichten

  J. Stettner, Seminar zu aktuellen Fragen der Festkörperphysik und Materialwissenschaften, Sehlendorf, 25.-27.9.1997



• Surface sensitive X-ray diffraction from buried CoSi₂ layers

  J. Stettner, Seminar Division of Crystal Physics, Adam Mickiewicz University, Poznan, 25.4.1997



• Charakterisierung von rauhen MBE-Si/CoSi₂-Schichtsystemen mittels Röntgenstreuung

  J. Stettner, Seminar am Lehrstuhl für Materialverbunde, Technische Fakultät der Christian-Albrechts-Universität Kiel, 27.1.1997



• Surface sensitive X-ray diffraction from buried CoSi₂ layers

  J. Stettner, Seminar am CRMC2-CNRS, Marseille, 28.11.1996



• X-ray reflection from buried CoSi₂ layers

  D. Bahr, W. Press, J.-P. Schlomka,J. Stettner , M. Tolan, U. Zimmermann, International Workshop on Determination of Surface Morphology by High Resolution Diffraction, Castle Wohldenberg, Hildesheim, 23.-27.9.1996



• Charakterisierung von rauhen MBE-Si/CoSi₂-Schichtsystemen mittels Röntgenstreuung

  J. Stettner, Kolloquium des Instituts für Experimentalphysik, Christian-Albrechts-Universität Kiel, 6.6.1996.



• Interface structure of MBE-grown CoSi₂/Si/CoSi₂ layers on Si(111): partially correlated roughness and diffuse X-ray scattering

  J. Stettner, L. Schwalowsky, O.H. Seeck, M. Tolan, W. Press, C. Schwarz, H. von Känel, Frühjahrstagung des Arbeitskreises Festkörperphysik bei der DPG, Regensburg, 25.-29.3.1996



• Charakterisierung von Si/CoSi₂-Schichtsystemen mittels oberflächenempfindlicher Röntgenbeugung

  J. Stettner, Vortrag im SFB-Kolloquium (292, 'Mehkomponentige Schichtsysteme') an der Friedrich-Alexander-Universität Erlangen-Nürnberg, 13.2.1996.



• Röntgenbeugung auf hochauflösenden Diffraktometern - Zielrichtung Materialeigenschaften

  J. Stettner, Workshop zu aktuellen Fragen der Festkörperphysik, Sehlendorf, 11.9.1991



• Strukturbestimmung von adsorbierten Butadienmolekülen auf Graphit mittels Röntgenbeugung

  J. Stettner, J. Süßenbach, W. Press, 55. Physikertagung der DPG und Frühjahrstagung der Arbeitskreises Festkörperphysik bei der DPG, Münster, 8.-12.4.1991

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