Institute of Experimental and Applied Physics, Christian-Albrechts-Universität zu Kiel
Anomalous potential dependence in homoepitaxial Cu(001) electrodeposition: An in situ surface x-ray diffraction study
F. Golks, J. Stettner, Y. Gründer, K. Krug, J. Zegenhagen, O.M. Magnussen, Phys. Rev. Lett. 108 , 256101 (2012)
Structure and electrocompression of chloride adlayers on Cu(111)
Y. Gründer, A. Drünkler, F. Golks, G. Wijts, J. Stettner, J. Zegenhagen, O.M. Magnussen, Surf. Sci. 605 , 1732-1737 (2011)
High-speed in situ surface X-ray diffraction studies of the electrochemical dissolution of Au(001)
F. Golks, K. Krug, Y. Gründer, J. Zegenhagen, J. Stettner, O. M. Magnussen, J. Am. Chem. Soc. 133 , 3772-3775 (2011)
Real-Time Surface X-ray Scattering Study of Au(111) Electrochemical Dissolution
K. Krug, D. Kaminski, F. Golks, J. Stettner, O.M. Magnussen, J. Phys. Chem. C 114 , 18634-18644 (2010)
Reversal of chloride-induced subsurface buckling in the electrochemical environment: An in situ surface x-ray diffraction and density functional theory study
Y. Gründer, D. Kaminski, F. Golks, K. Krug, J. Stettner, O. Magnussen, A. Franke, J. Stremme, E. Pehlke, Phys. Rev. B 81, 174114 (2010)
Structure and redox behavior of azobenzene-containing monolayers on Au(111): A combined STM, X-ray reflectivity and voltammetry study
J. Jung, B. Baisch, D. Kaminski, K. Krug, A. Elsen, T. Weineisen, D. Raffa, J. Stettner, C. Bornholdt, R. Herges, O.M. Magnussen, J. Electroanal. Chem. 619-620, 152 (2008)
Investigating surface dynamics with inelastic X-ray scattering
B.M. Murphy, M. Müller, J. Stettner, H. Requardt, J. Serrano, M. Krisch, W. Press, Journal of Physics C: Condensed Matter 20, 224001 (2008)
Time-dependent diffraction studies of Au(100) electrode surface
D. Kaminski, K. Krug, F. Golks, J. Stettner, O.M. Magnussen, J. Phys. Chem. C 111, 17067 (2007)
In situ diffraction studies of electrode surface structure during gold electrodeposition
O.M. Magnussen, K. Krug, A.H. Ayyad, J. Stettner, Electrochim. Acta 53, 3449 (2007)
In-situ surface x-ray diffraction studies of homoepitaxial electrochemical growth on Au(100)
K. Krug, J. Stettner, O.M. Magnussen, Phys. Rev. Lett., 96 246101 (2006)
Phonon modes at the 2H-NbS2 surface observed by grazing incidence inelastic x-ray scattering
B.M. Murphy, H. Requardt, J. Stettner, J. Serrano, M. Krisch, M. Müller, W. Press, Phys. Rev. Lett. 95 (2005) 256104
Electrocompression of the Au(111) surface layer during Au electrodeposition
A. Ayyad, J. Stettner, O. Magnussen, Phys. Rev. Lett. 94 (2005) 066106
Embedding of gold nanoclusters on polystyrene surfaces: influence of the surface modification on the glass transition
R. Weber, I. Grotkopp, J. Stettner, M. Tolan, W. Press, Macromolecules 36 (2003) 9100
Surface behaviour at the charge density wave transition in NbSe2
B.M. Murphy, J. Stettner, M. Traving, M. Sprung, I. Grotkopp, M. Müller, M. Tolan, W. Press, Physica B 336 (2003) 103
Band structure of the misfit compound (PbS)NbS2 compared to NbSe2: Experiment and theory
J. Brandt, J. Kanzow, K. Roßnagel, L. Kipp, M. Skibowski, E. Krasowskii, W. Schattke, M. Traving, J. Stettner, W. Press, C. Dieker, W. Jäger, J. Electron. Spectrosc. relat. Phenom. 114-116 (2001) 555
X-ray reflecivity study on the surface and bulk glass transition of polystyrene
R. Weber, K.-M. Zimmermann, M. Tolan, J. Stettner, W. Press, O.H. Seeck, J. Erichsen, V. Zaporojtchenko, T. Strunskus, F. Faupel Phys. Rev. E 64 (2001) 061508/1-5
Phase determination of x-ray reflection coefficients
K.-M. Zimmermann, M. Tolan, R. Weber, J. Stettner, A.K. Doerr, W. Press, Phys.Rev. B 62 (2000) 10377-10382
X-Ray Scattering Study of Porous Silicon Layers
V. Chamard, G. Dolino, J. Stettner, Physica B 283 (2000) 135--138
Kinetic Evolution of Self-Organised SiGe Nanostructures
A. Ronda, A. Abdallah, J. M. Gay, J. Stettner, I. Berbezier, Appl.Surf.Sci. 162-163 (2000) 576--583
Structural investigation of oxidized allotaxially grown CoSi2 on Si(001) by X-ray scattering
I.D. Kaendler, J.-P. Schlomka, M. Tolan, J. Stettner, W. Press, L. Kappius, S. Mantl , J.Appl.Phys. 87 (2000) 133--140
X-ray Characterization of buried allotaxially grown CoSi2layers in Si(100)
U. Zimmermann, J.-P. Schlomka, M. Tolan, J. Stettner, W. Press, M. Hacke, S. Mantl, J.Appl.Phys. 83 (1998) 5823-5830
Kadar-Parisi-Zhang growth of amorphous silicon on Si/SiO2
M. Lütt, J.-P. Schlomka, M. Tolan, J. Stettner, O.H. Seeck, W. Press, Phys.Rev. B 56 (1997) 4085-4091
Correlations in the interface structure of Langmuir-Blodgett-films observed by x-ray scattering
V. Nitz, M. Tolan, J.-P. Schlomka, O.H. Seeck, J. Stettner, W. Press, M. Stelzle, E. Sackmann, Phys.Rev. B 54 (1996) 5038-5050
Characterization of Si/Ge interfaces by diffuse X-ray scattering in the region of total external reflection
J.-P. Schlomka, M.R. Fitzsimmons, R. Pynn, J. Stettner, O.H. Seeck, M. Tolan, W. Press, Physica B 221 (1996) 44-52
Roughness of surfaces and interfaces
W. Press, M. Tolan, J. Stettner, O.H. Seeck, J.-P. Schlomka, V. Nitz, L. Schwalowsky, P. Müller-Buschbaum, D.Bahr, Physica B 221 (1996) 1-9
Interface structure of MBE-grown CoSi2/Si/CoSi2 layers on Si(111): Partially correlated roughness and diffuse x-ray scattering
J. Stettner, L. Schwalowsky, O. H. Seeck, M. Tolan, W. Press, C. Schwarz, H. v. Känel, Phys.Rev.B 51 (1995) 2311-2321
X-ray Diffraction from Si/Ge Layers: Diffuse Scattering in the Region of Total External Reflection
J.-P. Schlomka, M. Tolan, L. Schwalowsky, O.H. Seeck, J. Stettner, W. Press, Phys.Rev.B 51 (1995) 2311-2321
X-ray Diffraction from Mesoscopic Systems
W. Press, D. Bahr, M. Tolan, B. Burandt, M. Müller, P. Müller-Buschbaum, V. Nitz, J. Stettner, Physica B 198 (1994) 42-47
X-ray grazing incidence diffraction from polycrystalline Sb films on single-crystal substrates
E. Findeisen, L. Brügemann, J. Stettner, M. Tolan, Journal of Physics C: Condensed Matter 5 (1993) 8149-8158