Publikationen
Correlation between properties of direct current magnetron sputtered thin niobium nitride films and plasma parameters. Thin Solid Films. 742, 139046 (2021).
Diagnostics of process plasma used for the production of memristive devices. Journal of Physics: Conference Series. 1492, 012002 (2020).
Correlation between sputter deposition parameters and I-V-characteristics in double-barrier memristive devices. Journal of Vacuum Science & Technology B. 37, 061203 (2019).
Die Geschichte der Gasentladungsphysik – Beobachtungen, Experimente und Ergebnisse aus drei Jahrhunderten. Vakuum in Forschung und Praxis. 3021335, 34-42 (2018).